Geol/Chem/Phys 420: 

Electron Microscopy and X-ray Microanalysis
  
Spring 2012

Concord University

Professor:

Dr. Stephen C. Kuehn (Steve)
(home page)
Office:

Science 106
Office Hours:
(Spring 2012)

Tu 8:30-9:25, W 9-11 and by appointment
Teaching Schedule:

Spring 2012
Phone:

304-384-6322

High-magnification electron imaging and microanalysis for elemental compositions are important scientific and industrial tools in many disciplines including geology, chemistry, biology, materials science, metallurgy, engineering, archaeology, and even art history. This 1-credit short-course will survey both operating principles and applications and will include hands-on experience with Concord's electron microprobe and micro-XRF instruments.

Syllabus

References, background, etc. (links page)


Slides used in class
4/page (bigger pictures)
6/page (less paper, smaller file)
Introduction and History
01_Intro_History_4.pdf
01_Intro_History_6.pdf
Beam/sample interaction, imaging & mapping
02_Beam_Imaging_4.pdf
02_Beam_Imaging_6.pdf
X-ray analysis fundamentals 1
03_X-ray_analysis_4.pdf
03_X-ray_analysis_6.pdf
X-ray analysis fundamentals 2
04_X-ray_analysis2_4.pdf
04_X-ray_analysis2_6.pdf

Study Guide



PDF Course Flyer

ARL SEMQ Electron Microprobe


Horiba micro-XRF










Energy-dispersive X-ray Spectrum




Last modified: 13-April-2012