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Horiba XGT-5000 micro-X-ray fluorescence (XRF) analytical microprob
e is housed on the third floor of the Science building and is capable of qualitatively mapping the elemental composition of solid materials from areas as large as 10 cm x 10 cm with a
Horiba micro-XRF
resolution of 0.01-0.1 mm. Elements from atomic number 11 (Na, sodium) and higher may be detected. Using transmitted X-ray imaging on the XRF, internal structures and defects may also be studied.

Depending on the material to be studied, little or no sample preparation may be required. Samples studied on the XRF are at atmospheric pressure, and, unlike the electron microprobe, there is no requirement that materials be conductive.

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Content revised 5-December-2011